APA   Click to copy
Prasad, A., & Roy, S. (2015). Global sensitivity based dimension reduction for fast variability analysis of nonlinear circuits. 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS).

Chicago/Turabian   Click to copy
Prasad, A., and Sourajeet Roy. “Global Sensitivity Based Dimension Reduction for Fast Variability Analysis of Nonlinear Circuits.” 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS) (2015).

MLA   Click to copy
Prasad, A., and Sourajeet Roy. “Global Sensitivity Based Dimension Reduction for Fast Variability Analysis of Nonlinear Circuits.” 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015.

@article{a2015a,
  title = {Global sensitivity based dimension reduction for fast variability analysis of nonlinear circuits},
  year = {2015},
  journal = {2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)},
  author = {Prasad, A. and Roy, Sourajeet}
}